The developed high-speed three-dimensional scanning force microscopy enabled the measurement of 3D force distribution at solid-liquid interfaces at 1.6 s/3D image. With this technique, 3D hydration ...

By combining atomic force microscopy (AFM) with a Hadamard productbased image reconstruction algorithm, scientists ...

Nanomechanical systems developed at TU Wien have now reached a level of precision and miniaturization that will allow them to ...

Atomic force microscopy (AFM) has evolved into an indispensable tool for nanoscale investigation, enabling detailed imaging and quantification of surface topography as well as mechanical properties.

Atomic force microscopy (AFM) and infrared (IR) spectroscopy have emerged as complementary techniques that enable the precise characterisation of materials at the nanoscale. AFM provides ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Researchers at the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, used high-speed atomic force microscopy to observe dynamic changes in AMPA receptors, which are vital for brain ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...