The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
March 30, 2012. Keithley Instruments Inc. has enhanced the capabilities of its S530 parametric test systems for high-speed production parametric test. Supported by the latest version of Keithley Test ...
Yield ramp has historically been the fab's burden. The yield ramp cycle was cleanly partitioned into three phases: process development, pilot production and volume production (Fig. 1). 1. Industry has ...
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