In reliability engineering, few indicators are as consistently revealing as the particles that infiltrate a lubrication ...
We analyse the performance of a recursive Monte Carlo method for the Bayesian estimation of the static parameters of a discrete-time state-space Markov model. The algorithm employs two layers of ...
As semiconductor devices become more complex and the critical particle size for today’s cutting-edge technology nodes falls into the sub-10 nm size range, controlling and mitigating potentially ...
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