Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
-- Innovative mating technique resolves the problems with intermittent power delivery and signal interruptions inherent in traditional MMCX connectors -- Ideally suited for critical sensors and video ...
The past decade�s build-up of RF ATE for second-generation (2G) cellular transceivers now is testing more than two billion RF devices annually (Figure 1). Next-generation consumer wireless devices ...
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